Solid state electronic devices /
Streetman, Ben G.,
Solid state electronic devices / Ben G. Streetman and Sanjay Kumar Banerjee. - 7th ed. - New York: Pearson Education, c2016. - xviii, 624p.: illu. chart ; 25 cm. - Prentice-Hall series in solid state physical electronics. .
Includes bibliographical references and index.
1. Crystal Properties and Growth of Semiconductors --
2. Atoms and Electrons --
3. Energy Bands and Charge Carriers in Semiconductors --
4. Excess Carriers in Semiconductors --
5. Junctions --
6. Field-Effect Transistors --
7. Bipolar Junction Transistors --
8. Optoelectronic Devices --
9. Integrated Circuits --
10. Negative Conductance Microwave Devices --
11. Power Devices --
App. I. Definitions of Commonly Used Symbols --
App. II. Physical Constants and Conversion Factors --
App. III. Properties of Semiconductor Materials --
App. IV. Derivation of the Density of States in the Conduction Band --
App. V. Derivation of Fermi-Dirac Statistics --
App. VI. Dry and Wet Thermal Oxide Thickness as a Function of Time and Temperature.
9780133356038 0133356035
2013037102
Semiconductors.
TK7871.85 / .S77 2015
621.38152 / St831s
Solid state electronic devices / Ben G. Streetman and Sanjay Kumar Banerjee. - 7th ed. - New York: Pearson Education, c2016. - xviii, 624p.: illu. chart ; 25 cm. - Prentice-Hall series in solid state physical electronics. .
Includes bibliographical references and index.
1. Crystal Properties and Growth of Semiconductors --
2. Atoms and Electrons --
3. Energy Bands and Charge Carriers in Semiconductors --
4. Excess Carriers in Semiconductors --
5. Junctions --
6. Field-Effect Transistors --
7. Bipolar Junction Transistors --
8. Optoelectronic Devices --
9. Integrated Circuits --
10. Negative Conductance Microwave Devices --
11. Power Devices --
App. I. Definitions of Commonly Used Symbols --
App. II. Physical Constants and Conversion Factors --
App. III. Properties of Semiconductor Materials --
App. IV. Derivation of the Density of States in the Conduction Band --
App. V. Derivation of Fermi-Dirac Statistics --
App. VI. Dry and Wet Thermal Oxide Thickness as a Function of Time and Temperature.
9780133356038 0133356035
2013037102
Semiconductors.
TK7871.85 / .S77 2015
621.38152 / St831s