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Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

Servín, Manuel

Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. - Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. c 2014. - xvi, 327 p. : ill. : 25 cm

Includes bibliographical references and index.

9783527411528 9783527681075


Interferometry.
Optical measurements.
Diffraction patterns.


Last Updated Oct 16, 2019.
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