TY  - GEN
AU  - Servín,Manuel
AU  - Quiroga,J.Antonio
AU  - Padilla,J.Moises
TI  - Fringe pattern analysis for optical metrology: theory, algorithms, and applications 
SN  - 9783527411528  
PY  - 2014///.
CY  - Weinheim, Germany
PB  - Wiley-VCH Verlag GmbH & Co.
KW  - Interferometry
KW  - Optical measurements
KW  - Diffraction patterns
N1  - Includes bibliographical references and index
UR  - https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/9783527681075?download=true
ER  -