| 000 | 00843nam a2200241 4500 | ||
|---|---|---|---|
| 003 | BD-DhGUBL | ||
| 005 | 20251012092026.0 | ||
| 008 | 251011m20142013uk a|||| |||| 001 0 eng d | ||
| 020 | _a9781118511886 | ||
| 020 | _a9781118703328 | ||
| 040 |
_aBD-DhGUBL _cBD-DhGUBL _dBD-DhGUBL |
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| 082 |
_223 _a621.3815 |
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| 100 | _aVoldman, Steven H. | ||
| 245 |
_aElectrical Overstress (EOS) / _cSteven H. Voldman |
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| 260 |
_aWest Sussex, United Kingdom : _bJohn Wiley & Sons, _cc 2014. |
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| 300 |
_axxiii, 344 p. : _bill. |
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| 504 | _aincludes bibliographical references and index. | ||
| 650 |
_aSemiconductors _vFailures |
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| 650 |
_aSemiconductors _vProtection |
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| 650 | _aTransients (Electricity) | ||
| 856 |
_uhttps://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/9781118703328?download=true _yClick here to dawn load |
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| 942 |
_2ddc _cBK |
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| 999 |
_c5246 _d5246 |
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