000 01041nac a2200265 a 4500
001 990197280790107026
003 BD-DhGUBL
005 20251105122327.0
008 251105s2014 ge a b 001 0 ger d
020 _a9783527411528
020 _a9783527681075
040 _aBD-DhGUBL
_eBD-DhGUBL
_cBD-DhGUBL
100 1 _aServĂ­n, Manuel
_eauthor.
245 1 0 _aFringe pattern analysis for optical metrology :
_btheory, algorithms, and applications /
_cManuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
260 _aWeinheim, Germany :
_bWiley-VCH Verlag GmbH & Co.
_cc 2014.
300 _axvi, 327 p. :
_bill. :
_c25 cm
504 _aIncludes bibliographical references and index.
650 0 _aInterferometry.
650 0 _aOptical measurements.
650 0 _aDiffraction patterns.
700 1 _aQuiroga, J. Antonio,
_eJoint author.
700 1 _aPadilla, J. Moises
_eJoint author.
856 _uhttps://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/9783527681075?download=true
_yClick here to dawnload
942 _2ddc
_cBK
999 _c5365
_d5365